Mao M.-H.

Graduate Institute of Electronics Engineering; Department of Electrical Engineering; Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 10617, Taiwan

Presentations

NM05 – Modeling the Effects of Surface Recombination Velocity in Scanning Photocurrent Microscopy for Ohmic-Contact Thin-Film Devices

Wei Y.-C., Mao M.-H.

We studied numerically the carrier transport and confirmed the feasibility of our scanning photocurrent microscopy model in the minority carrier decay length extraction under different surface recombination velocities at the surfaces of ohmic-contact thin-film devices.

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